FICT at SWTest Asia 2024
Our Booth

Our Technical Session
Title:"Space Transformer Organic Technologies for Next-Generation Probe Card Substrates"
Speaker: Yo NOZAKA
Abstract :
"The two primary challenges the probe card manufacturers face in developing next-generation probe card substrates are improving pin pitch and increasing pin count. The presentation aims to share our proactive approach to addressing these challenges using key organic technologies for space transformers. Our goal is to achieve a pin pitch of less than 30μm by 2026, along with more than 20 buildup layers by 2030. We will highlight the latest data on our multi-layer glass substrate technology, which we believe will pave the way for new advancements."
The content of this presentation will be soon available on SWTest Asia 2024 website.
For further information, please do not hesitate to contact us at the address provided below: fict-exhibition@fict-g.com